In the temperature rise test of reactive power compensation device of low-voltage switchgear, the temperature rise acquisition module can not bear the rated voltage of switchgear. The design of multiple temperature rise acquisition modules can effectively solve this problem and realize the temperature rise test detection of reactive power compensation device. After the capacitor is fully put into operation, the capacitor input phase-to-phase voltage is the rated voltage of the equipment. During the temperature rise test, it is necessary to measure the temperature rise of the terminal A, B, and C. However, the temperature rise acquisition module cannot withstand a large voltage value. Therefore, multiple modules are designed. The temperature rise acquisition channel of each module only measures the temperature rise of one phase. The capacitor housing also needs to be measured by a separate module to prevent the module from bearing a higher voltage.

Zhi Li, Zhenjing Yan, Wei Jing, Shaojie Wang, Wanli Rong. Research on temperature rise test of low voltage reactive power compensation device. International Journal of Frontiers in Engineering Technology (2023), Vol. 5, Issue 11: 94-98. https://doi.org/10.25236/IJFET.2023.051114.

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