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Academic Journal of Engineering and Technology Science, 2023, 6(3); doi: 10.25236/AJETS.2023.060308.

Research status and key technology analysis of integrated circuit lead frame


Dongyang Han

Corresponding Author:
Dongyang Han

School of Electrical Engineering, Northwest Minzu University, Lanzhou, 730124, China


With the rapid development of integrated circuits, its lead frame is increasingly high precision, which puts forward higher requirements for the current research status and key technologies. In this paper, the higher requirements and innovations for the structure control of complex alloying, deformation, and heat treatment of high-precision lead frames manufactured by etching are reviewed. The relevant industrial chain at home and abroad and its current situation are introduced. The key manufacturing technology of high-precision etched lead frame is analyzed. At last, the key technology prospect and the development trend of integrated circuit lead frames in our country are discussed.


Integrated circuit, Lead frame, High etching technology, Industrial chain

Cite This Paper

Dongyang Han. Research status and key technology analysis of integrated circuit lead frame. Academic Journal of Engineering and Technology Science (2023) Vol. 6, Issue 3: 43-49. https://doi.org/10.25236/AJETS.2023.060308.


[1] Kim Hongchan, Ryu Hojun, Kang SungIl, Bae InSeob. Two-Layer Rt-QFN: A New Coreless Substrate Based on Lead Frame Technology [J]. Coatings, 2022, 12(5).

[2] Ping Liu, Juanhua Su, Qiming Dong, Hejun Li. Optimization of aging treatment in lead frame copper alloy by intelligent technique [J]. Materials Letters, 2005, 59(26).

[3] Frederick Ray I. Gomez, Alyssa Grace S. Gablan, Anthony R. Moreno,Nerie R. Gomez. Augmented Leadframe Design for Stable Multi-Wire Ground Bonding [J]. Journal of Engineering Research and Reports, 2021.

[4] Pennisi Salvatore. The Integrated Circuit Industry at a Crossroads: Threats and Opportunities [J]. Chips, 2022,1(3).

[5] Li Y, Zheng H, Chen Y, et al. Research on Key Technology of State Evaluation and Replacement Acquisition System of Intelligent Electric Energy Meter Based on Smart Grid[J]. IOP Conference Series: Earth and Environmental Science, 2020, 558(5):052053 (10pp).