The degradation mechanism of Hall current sensors is characterized by complexity, fluctuations, and nonlinearity, which poses a challenge to accurately predicting the lifetime of highly reliable and long-lived Hall current sensors. In this study, accelerated degradation tests were conducted on Hall current sensors, and performance degradation data was used to predict the sensor's reliability and remaining lifetime. Firstly, the working principle and degradation mechanism of Hall current sensors were analyzed, and the fluctuation of zero-point output voltage was identified as the performance degradation parameter. Next, the types of accelerated degradation models and test conditions were described, and a method based on the Weibull distribution was employed to estimate the pseudo-failure lifetime at various temperature stress levels under accelerated degradation testing. Finally, an accelerated model for the distribution parameters of pseudo-lifetime was derived using the Arrhenius model, thereby completing the reliability and remaining lifetime prediction of Hall current sensors under normal working conditions.

Shike Wei, Dong Xu, Xuan Liu, Jian Yang, Jiayu Zhang, Yishuai Cui. Prediction of Remaining Lifetime of Hall Current Sensor Based on Weibull Distribution. International Journal of Frontiers in Engineering Technology (2023), Vol. 5, Issue 8: 1-7. https://doi.org/10.25236/IJFET.2023.050801.

[1] Lu Ying, Wang Zhenyu, Zhao Yan, et al. Research on acceler-ated degradation life evaluation method for electronic components[J]. Computer Measurement and Control, 2021, 29(11):6. 

[2] Sun Quan, Tang Yanzhen, Feng Jing, et al. Reliability assess-ment of metallized film capacitors using reduced degradation testsample [J]. Quality and Reliability Engineering International, 2013, 29(2): 259. 

[3] Wang Xiaofei, Wang Bingxing, Wu Wenhua, et al. Reliabilityanalysis for accelerated degradation data based on the Wienerprocess with random effects[J]. Quality and Reliability Engineering, 2020(2): 1. 

[4] Li Zhengbo, Liu Fang, Cai Haiyan. The hardware design of the rudder control circuit testing equipment [J]. Instrumentation, 2014(6): 63-65, 425-432. 

[5] Zhao Jianyin, Liu Fang. Reliability assessment method for acceler-ated degradation failure products [J]. Journal of Harbin Institute ofTechnology, 2008, 40(10): 1669. 

[6] Laidler K J. The development of the Arrhenius equation[J]. Journal of Chemical Education, 1984, 61: 494. 

[7] Endicott H, Hatch B. Application of the Eyring model to capacitor aging data[J]. IEEE Transactions on Component Parts, 1965, 12(01): 34-41. 

[8] Wang F K and Chu T P. Lifetime predictions of LED-based light bars by accelerated degradation test [J]. Microelectronics Reliability, 2012, 52(07): 1332-1336.